Akademik Veri Yönetim Sistemi
EGE 13th INTERNATIONAL CONFERENCE ON APPLIED SCIENCES, İzmir, Türkiye, 13 - 15 Haziran 2025, ss.416-420, (Tam Metin Bildiri)
This study examined the reflection behavior of TE (transverse electric) polarized
electromagnetic waves incident on structures composed of multilayer films made of lossless
dielectric layers. The frequency-dependent variations of reflectance for waves at normal and
oblique incidence angles were analyzed in detail for different angles. The results showed that
reflectance approached zero at certain frequencies, while reaching maximum levels at others.
Additionally, the effects of changes in film thickness on reflectance were examined, with
reflectance variations—especially at oblique incidence angles—illustrated through graphs.
Initially, reflectance curves for a single-layer film were plotted under different incidence angles.
Minimum reflectance values were obtained at specific frequencies under normal incidence,
whereas an increase in reflectance was observed with increasing incidence angle. Subsequently,
reflectance values were calculated based on changes in the thickness of an air layer inserted
between two dielectric layers. In conclusion, the reflection performance of thin film layers was
comprehensively analyzed, and the findings were presented with graphical support.