Akademik Veri Yönetim Sistemi
EGE 13th INTERNATIONAL CONFERENCE ON APPLIED SCIENCES, İzmir, Türkiye, 13 - 15 Haziran 2025, ss.421-425, (Tam Metin Bildiri)
In this study, the reflection characteristics of TM-polarized (transverse magnetic)
electromagnetic waves on film structures composed of multilayer dielectric materials were
investigated. The frequency-dependent variation of reflectance was analyzed for both normal
and oblique incidence. The analyses showed that reflectance values approached zero at certain
frequencies. Reflection behaviors were thoroughly evaluated through graphs obtained for film
structures with different dielectric constants. Additionally, changes in reflectance depending on
the thickness of the film layer were examined, and reflection variations, especially under
oblique incidence, were illustrated with graphs. Initially, a single-layer film structure was
considered, and reflectance variations were plotted for different angles of incidence. While
minimum reflectance was achieved at normal incidence, reflectance increased with increasing
incidence angle. Subsequently, an air layer was introduced between two dielectric layers, and
reflectance values were calculated depending on the thickness of the air layer expressed in terms
of wavelength. It was found that when the air layer reached several wavelengths in thickness,
the reflectance approached unity. In conclusion, the reflection properties of thin film layers
were analyzed in detail, and the results were presented graphically.