Determination of the complex permittivity of materials with transmission/reflection measurements in rectangular waveguides

Şimşek S., Işik C., Topuz E., Esen B.

AEU - International Journal of Electronics and Communications, vol.60, no.9, pp.677-680, 2006 (SCI-Expanded, Scopus) identifier identifier

  • Publication Type: Article / Article
  • Volume: 60 Issue: 9
  • Publication Date: 2006
  • Doi Number: 10.1016/j.aeue.2006.02.010
  • Journal Name: AEU - International Journal of Electronics and Communications
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.677-680
  • Keywords: scattering from dielectric obstacles in rectangular waveguides, complex permittivity measurement
  • Manisa Celal Bayar University Affiliated: Yes

Abstract

Determination of the complex permittivity of materials via transmission/reflection measurement in rectangular waveguides is formulated as an inverse scattering problem. The presented approach is directly applicable to measurements performed with various sample sizes and orientations. The predicted results are compared with measurements and good agreement is obtained. © 2006 Elsevier GmbH. All rights reserved.