Determination of the complex permittivity of materials with transmission/reflection measurements in rectangular waveguides

Şimşek S., Işik C., Topuz E., Esen B.

AEU - International Journal of Electronics and Communications, cilt.60, sa.9, ss.677-680, 2006 (SCI-Expanded, Scopus) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 60 Sayı: 9
  • Basım Tarihi: 2006
  • Doi Numarası: 10.1016/j.aeue.2006.02.010
  • Dergi Adı: AEU - International Journal of Electronics and Communications
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.677-680
  • Anahtar Kelimeler: scattering from dielectric obstacles in rectangular waveguides, complex permittivity measurement
  • Manisa Celal Bayar Üniversitesi Adresli: Evet

Özet

Determination of the complex permittivity of materials via transmission/reflection measurement in rectangular waveguides is formulated as an inverse scattering problem. The presented approach is directly applicable to measurements performed with various sample sizes and orientations. The predicted results are compared with measurements and good agreement is obtained. © 2006 Elsevier GmbH. All rights reserved.